Embedded World 25 to 27 February 2020 - Nuremberg E4You joint stand in hall 4, stand 4-338

The embedded world success story
In 2019, 30,895 trade visitors gathered information from the 1,117 exhibitors at embedded world. This leading international trade fair will certainly remain one of the most important marketing and sales tools for the embedded industry in the future. This is proven by the high level of visitor satisfaction. More than 99% of visitors were extremely positive in their assessment of the range of products on offer, the information opportunities at the stands and the organisation of the trade fair. 41% of the visitors were international guests, mainly from the European Union, but also from the rest of Europe, Africa, Asia, Australia/Oceania and America.
E4You member presentations at the embedded world Conference
Wednesday 26. February 2020
Session 3.2 II: Embedded OS IV – Linux II
14:30-15:00
Advantages of Heterogeneous SoCs in IoT Applications
Robert Goellner, DH electronics
Session 6.4 I: SW-Engineering IV – Testing & Debugging I
10:30-11:00
Fully Automated Self-test and Calibration for Hardware in the Loop Test Systems
Dr. Kristian Trenkel, iSyst Intelligente Systeme
12:00-12:30
Conclusive On-the-fly Validation of High-Level Functional Tests
Dr. Thomas Preusser, Accemic Technologies
12:30-13:00
Test the Test – Enhanced Test Quality with Mutation Testing
Michael Wittner, Razorcat Development
Session 6.4 II: SW-Engineering V – Testing & Debugging II
14:00-14:30
Non-intrusive Software Coverage Estimation for Safety-Critical System Certification
Martin Heininger, HEICON – Global Engineering
16:00 – 16:30
Debugging Complex Failures of Real-Time Multi-Core System
Albert Schulz, Accemic Technologies, Franz Münz, Airbus Defence and Space
17:00-17:30
Usage of Debugger in Hardware in the Loop Tests
Dr. Kristian Trenkel, iSyst Intelligente Systeme
Session 10.4 I: SoC IV – System Technology I
12:30-13:00
FPGA-based Modelling of Aging Effects and Implementation of IP-Cores for Wear-Out-Detection
Josef Schmid, iSyst Intelligente Systeme
Overview of participating members